Olympus U-MDICT3 Cube Housing w/ Fixed Analyzer for Transmitted DIC U-TAD 90 (with top lens) /

90 (with top lens) / 0

essential for any imaging workflow where chromatic shift between channels would compromise data integrity

💡 Brightfield/Darkfield (BD) Capability — Dual-mode imaging for enhanced contrast and defect detection on reflective surfaces

Electronics and semiconductor inspection — surface defect detection on wafers and components using an IX series inverted microscope

OLYMPUS ACH N 20X POLARIZED LIGHT OBJECTIVE

Olympus U-MDICT3 Cube Housing w/ Fixed Analyzer for Transmitted DIC U-TAD 90 (with top lens) /Olympus U MDICT3 Cube Housing with Fixed Analyzer for Transmitted Light DIC Cube housing with integrated fixed analyzer for transmitted light differential interference contrast (DIC) microscopy on Olympus BX3 series microscopes provides a compact, integrated DIC analyzer solution. Fixed Analyzer Cube integrated analyzer in a cube housing for transmitted light DIC Compact Design self contained cube unit for easy installation in the BX3 cube turret